SWT-7000Ⅳseries
+SFN-325
NEW
SWT-7000Ⅳseries
SPECIFICATION
Optional SWT probes are interchangeable.
◆ Dual type : SFN-325※
◆ For ferrous : SFe type
◆ For non-ferrous : SNFe type
※The new SFN-325 can not be used with SWT-7000, SWT-7000Ⅱ,SWT-7000Ⅲ series but with SWT-7000Ⅳsereis only
◆ For ferrous : SFe type
◆ For non-ferrous : SNFe type
※The new SFN-325 can not be used with SWT-7000, SWT-7000Ⅱ,SWT-7000Ⅲ series but with SWT-7000Ⅳsereis only
Probe type
Dual SFN-325 (exclusive for SWT-7000Ⅳ series)
Measuring method
Electromagnetic/Eddy current dual use
Measuring range
Ferrous：0～3.00mm
Nonferrous：0～2.50mm
Nonferrous：0～2.50mm
Substrate detection
Automatic or manual switching
Display resolutions
1μm：0～999μm
By switching,
0.1μm：0～400μm,
0.5μm：400～500μm,
0.01mm：（ferrous 1.00～3.00mm) ,（nonferrous 1.00～2.50mm）
By switching,
0.1μm：0～400μm,
0.5μm：400～500μm,
0.01mm：（ferrous 1.00～3.00mm) ,（nonferrous 1.00～2.50mm）
Accuracy (place the probe perpendicularly
Ferrous ＆nonferrous dual use
0～100μm：±1μｍ or ±2％ the read value（ferrous）
101μm～3.00mm：±2％（nonferrous）
101μm～2.50mm：±2％
0～100μm：±1μｍ or ±2％ the read value（ferrous）
101μm～3.00mm：±2％（nonferrous）
101μm～2.50mm：±2％
Probe
One point contact constant pressure type,
with V cut φ13×51mm, 72g
with V cut φ13×51mm, 72g
Option
V type probe adaptors (3 types: less Φ5, Φ5～10, Φ10～20 )
Accessories
Calibration standards (plastic foils)
Zero plate （ferrous, nonferrous dual）
Zero plate （ferrous, nonferrous dual）
Measuring objectives
Fe substrate: coating, lining, thermal spraying, plating on magneticmetal like iron, steel (except electrolyte nickel plating)
NFe substrate: insulated films on non-magnetic metal like aluminum, copper
NFe substrate: insulated films on non-magnetic metal like aluminum, copper
Others
※The SWT-7000 III series has been remodeled into the 7000 IV series.
※SWT-7000III series and 7000IV series probes are not compatible.
※SWT-7000III series and 7000IV series probes are not compatible.
catalog
The new dual probe SFN-325 with auto (intelligent ) setting provides you with easy and simple operation： The probe SFN-325 can be used with SWT-7000 Ⅳ series (7000Ⅳ, 7200Ⅳ) for measurements of both Fe and NFe metal substrates.