SWT-7000IIIseries
+FN-325
SWT-7000IIIseries
SPECIFICATION
Optional SWT probes are interchangeable.
◆ Dual type : FN-325※
◆ For ferrous : Fe type
◆ For non-ferrous : NFe type
※The new FN-325 can not be used with SWT-7000, SWT-7000Ⅱ series but with SWT-7000Ⅲsereis only
◆ For ferrous : Fe type
◆ For non-ferrous : NFe type
※The new FN-325 can not be used with SWT-7000, SWT-7000Ⅱ series but with SWT-7000Ⅲsereis only
Probe type
Dual FN-325 (exclusive for SWT-7000Ⅲ series)
Measuring method
Electromagnetic/Eddy current dual use
Measuring range
Ferrous：0～3.00mm
Nonferrous：0～2.50mm
Nonferrous：0～2.50mm
Substrate detection
Automatic or manual switching
Display resolutions
1μm：0～999μm
By switching,
0.1μm：0～400μm,
0.5μm：400～500μm,
0.01mm：（ferrous 1.00～3.00mm) ,（nonferrous 1.00～2.50mm）
By switching,
0.1μm：0～400μm,
0.5μm：400～500μm,
0.01mm：（ferrous 1.00～3.00mm) ,（nonferrous 1.00～2.50mm）
Accuracy (place the probe perpendicularly
Ferrous ＆nonferrous dual use
0～100μm：±1μｍ or ±2％ the read value（ferrous）
101μm～3.00mm：±2％（nonferrous）
101μm～2.50mm：±2％
0～100μm：±1μｍ or ±2％ the read value（ferrous）
101μm～3.00mm：±2％（nonferrous）
101μm～2.50mm：±2％
Probe
One point contact constant pressure type,
with V cut φ13×52mm, 72g
with V cut φ13×52mm, 72g
Option
V type probe adaptors (3 types: less Φ5, Φ5～10, Φ10～20 )
Accessories
Calibration standards (plastic foils)
Zero plate （ferrous, nonferrous dual）
Zero plate （ferrous, nonferrous dual）
Measuring objectives
Fe substrate: coating, lining, thermal spraying, plating on magneticmetal like iron, steel (except electrolyte nickel plating)
NFe substrate: insulated films on non-magnetic metal like aluminum, copper
NFe substrate: insulated films on non-magnetic metal like aluminum, copper
The new dual probe FN-325 with auto (intelligent ) setting provides you with easy and simple operation： The probe FN-325 can be used with SWT-7000 Ⅲ series (7000Ⅲ, 7100Ⅲ, 7200Ⅲ) for measurements of both Fe and NFe metal substrates.